Efficient Electromagnetic Material Characterization Via 2-D Rectangular Waveguide Reduction Derek R. Dwyer

ISBN: 9781288294206

Published: November 13th 2012

Paperback

106 pages


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Efficient Electromagnetic Material Characterization Via 2-D Rectangular Waveguide Reduction  by  Derek R. Dwyer

Efficient Electromagnetic Material Characterization Via 2-D Rectangular Waveguide Reduction by Derek R. Dwyer
November 13th 2012 | Paperback | PDF, EPUB, FB2, DjVu, audiobook, mp3, RTF | 106 pages | ISBN: 9781288294206 | 4.25 Mb

A new, low-frequency, rectangular waveguide-based electromagnetic material characterization technique is developed that will reduce the test sample size in two dimensions realizing up to 50 percent reduction in sample cross-sectional area. To achieve this, custom made, reduced aperture, sample holder flanges were used that reduce the waveguides excessive cross-sectional dimensions, resulting in reduced sample fabrication costs. Additionally, MatLab code was developed to implement the rigorously derived modal-analysis solution that accommodates induced, higher-order transverse electric and transverse magnetic modes and accurately extract the reduced test samples constitutive parameters.

Experimental results using various test samples are compared to known, full-aperture measurements for both the reduced aperture waveguide configurations to verify the theoretical analysis. A differential error analysis is also performed for each configuration in an attempt to estimate the error associated with test sample thickness, aperture dimensions, and sample placement uncertainties.



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